Get Involved

MEMS and sensors of all types are used in countless applications, but all sensors must go through testing and reliability checks before being integrated into products. This workshop focuses on the current and emerging processes used to test MEMS and sensors.

What are the latest technologies, equipment and tools being developed for testing? What are the challenges facing the testing segment of the sensor supply chain? What factors are driving the industry for new solutions? What new methods or processes are making the testing of sensors quicker, more cost-effective and more efficient?

We hope you will join us as we answer these questions and discuss other exciting reliability topics with industry experts and research leaders. Networking sessions and exhibits will complement speaker presentations and topics.


Workshop Topics

This full-day workshop will provide attendees in-depth presentations, as well as networking and discussion opportunities, about the latest MEMS testing technologies and applications with topics such as:

  • Market trends and future industry projections
  • Testing equipment, tools, and methodologies
  • Front-end production equipment, tools, and processes
  • Packaging equipment, tools, and developments
  • Challenges and opportunities, including supply chain and ecosystem perspectives
  • “Pure play” foundries vs. platform-based design approaches, IDM vs. fabless approaches
  • Cost management and reduction
  • Scaling, yield improvement, rapid prototyping, and high volume production.
  • Testing for emerging technologies: TSVs, 3D stacking, wafer level packaging, CMOS MEMS integration, polymer and glass microfabrication, novel materials and coatings, lamination techniques, ultra-thin and flexible substrates.
  • EDA software and simulation tools
  • Test data collection and analysis
  • Technology transfer and intellectual property factors
  • Industry standards development

Who Should Attend

  • CEOs
  • CTOs
  • Entrepreneurs
  • VPs of engineering
  • VPs of manufacturing
  • VPs of operations
  • VPs of marketing
  • VPs of business development
  • MEMS foundry managers
  • Purchasing managers
  • Supply chain managers
  • Product managers and engineers
  • Marketing, sales and business development managers
  • MEMS and sensors production managers and engineers
  • MEMS and sensors design managers and engineers
  • Business development professionals
  • MEMS and sensors consultants
  • Media representatives
  • Industry analysts
  • Investment bankers

Workshop Location

Biltmore Hotel & Suites
2151 Laurelwood Road
Santa Clara, CA 95054


Hotel Information

The workshop and reception will be held at the Biltmore Hotel & Suites. A block of rooms has been reserved at the Biltmore for a negotiated rate of $209.00 per night. The room block cut-off date is July 18, 2017.

To reserve online, please go to http://bit.ly/Biltmore2017. You can also call in your reservation directly to 800-255-9925; please ask for the discounted room rate for the MEMS Testing & Reliability workshop.

The Biltmore is approximately 4 miles from the Mineta San Jose Airport (SJC). The hotel has airport shuttle service available – please call 408-988-8411 to schedule service.


Testimonials

“I had an exceptionally positive experience and you will definitely see me again at another event.”
Gergely Hantos, PhD Candidate, Heriot Watt University

“Thanks again for the excellent opportunity to speak at the workshop! I learned a lot and thank you for organizing it. It was well done and fantastic!”
Allyson Hartzell, Scientific Consultant, Veryst

“As a researcher on a company, I normally go to conferences/workshops strongly entitled on the scientific approach of MEMS or their potential value on the market, but very little is explained how the smart ideas published in those conferences make it to reality, and how difficult it is to actually have a final product. Your workshop provides that missing link, at least on testing and reliability. The problems and issues MEMS companies are facing to test and characterize their product not only to validate performance, but also to calibrate them, are orders of magnitude more difficult and challenging than traditional semiconductor companies. Your workshop provided such a strong knowledge on this manner. To be honest, I learned so much in this one-day workshop that I’m happy I was invited to speak, but I have the feeling I got much more than I gave.”
David Molinero, PhD, Senior MEMS Characterization Engineer, Wispry


Contact Information

Dr. Mike Pinelis
President and CEO
MEMS Journal, Inc.
734-277-3599 (phone)
mike@memsjournal.com

Jessica Ingram
Sr. Events Manager
MEMS Journal, Inc.
360-929-0114 (phone)
jessica@memsjournal.com